Reliability-Aware Device Design
Investigating trap-assisted tunneling, hot-carrier effects, and BTI in advanced CMOS and TFET devices for robust circuit performance.
PhD Researcher | VLSI | Semiconductor Devices | TCAD Simulation

I'm a PhD Scholar at IIT Bhubaneswar working in Semiconductor Device Modeling and Simulation, with a focus on circuit–device co-optimization using TCAD.
My research explores reliability-aware device design, self-heating effects, stress engineering, and advanced CMOS technologies — bridging device physics with practical circuit-level implications.
Focus areas within semiconductor device modeling and TCAD simulation.
Investigating trap-assisted tunneling, hot-carrier effects, and BTI in advanced CMOS and TFET devices for robust circuit performance.
Studying self-heating in nanoscale FinFETs and vertical TFETs via electro-thermal TCAD simulations for accurate lifetime prediction.
Exploring strain-engineered SiGe channels and workfunction modulation to enhance switching current ratio and subthreshold swing.
Designing charge-plasma hetero Z-shaped TFETs for label-free biosensing with high sensitivity and low power operation.
Ghai, V.; Dash, S.; Mishra, G.
Singh, R.; Ghai, V.; Naugarhiya, A.; Mishra, G.
Vaishnaw, A.; Jaiswal, A.; Bhange, G.; Ghai, V.; Mishra, G.
Sharma, M.; Ghai, V.; Dash, S.; Mishra, G.




Delivered 'Exploring Semiconductor Devices: A Practical Approach to VLSI' at NIT Raipur, organized in association with SERB, Government of India.
Conducted Verilog and Cadence labs at NIT Raipur and Introduction to Electronics / VLSI Design labs at IIT Bhubaneswar.
Lead author on reliability assessment of graphene-channel vertical TFETs (Elsevier).
Joined VLSI Design & Embedded Systems program; graduated with CPI 9.08.
Open to research collaborations, talks, and opportunities in device modeling & VLSI.